Sensitivity of an Atomic Force Microscope Cantilever with a Crack
نویسندگان
چکیده
منابع مشابه
Sensitivity of an Atomic Force Microscope Cantilever with a Crack
The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192761401143x